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Optical property measuring instrument - List of Manufacturers, Suppliers, Companies and Products

Optical property measuring instrument Product List

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Flat Panel Display Optical Characteristic Measurement Device FM Series

The "FM Series" is a system that automatically measures various optical characteristics of FPD (Flat Panel Display). It boasts high expandability and a wealth of options!

【Features】 ◆ A system that automatically measures various optical characteristics of FPDs (viewing angle characteristics, brightness, contrast, RGB chromaticity, gamma characteristics, flicker, power consumption, etc.). ◆ The basic configuration is simple, consisting of a luminance meter, signal generator, and dedicated measurement software, but it can be upgraded according to customer requirements to create a highly flexible measurement environment. ◆ Integration of customer-specified luminance meters and signal generators (including Technos' TS series) is also possible. We provide measurement stages compatible with various luminance meters and FPD modules of different sizes.

  • Image Processing Equipment

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Display Optical Characteristic Measurement Device "FM Series"

Brightness, chromaticity, viewing angle characteristics, and contrast evaluation of displays and light-emitting components are possible!

We would like to introduce the "FM Series" of display optical characteristic measurement devices that we handle. These devices are suitable for applications such as automatic measurement of the optical characteristics of display modules, optical evaluation of in-vehicle panel meters, and interior and exterior lighting components. Additionally, they are also suitable for optical evaluation of high-performance films, including transmittance, viewing angle characteristics, and transmittance uniformity evaluation. 【Product Lineup】 ■ FM-R700 ■ FM-R1000 ■ FM-X600 ■ FM-XR600 *For more details, please download the PDF or feel free to contact us.

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  • Optical Measuring Instruments

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Wafer-level light-emitting device optical characteristic measurement apparatus

Measure and inspect various optical characteristics of light-emitting devices such as VCSELs at the wafer level!

The "Wafer-Level Light Emitting Device Optical Characteristic Measurement System" is a system that analyzes the electrical and optical characteristics of various light-emitting devices such as VCSELs at the wafer level. In addition to the electrical characteristic measurements necessary for VCSEL characterization, it is capable of performing optical characteristic measurements at the wafer level, including light beam profile measurement, FFP measurement (radiation angle distribution measurement), IVL measurement, and polarization measurement. 【Features】 ■ By combining with manual probers and semi-automatic probers, it enables the measurement of various electrical and optical characteristics of light-emitting devices such as VCSELs at the wafer level. ■ The linkage function with the Form Factor semi-automatic prober system achieves automation, acceleration, and labor-saving of various measurements. ■ Equipped with our optical measurement and analysis software, Optometrics Customized Version for LD, among others. *For more details, please download the PDF or feel free to contact us.

  • Optical Measuring Instruments

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Film, sheet haze (haze value), total light transmittance

It is possible to measure haze (cloudiness) and total light transmittance with film or sheet samples!

We offer measurements of the total light transmittance, diffuse transmittance, parallel light transmittance, and haze of transparent plastic materials. The model used is NDH4000 (manufactured by Nippon Denshoku Industries Co., Ltd.), the measurement method is the integrating sphere method, the light source is a halogen lamp, the measurement beam is 11mm in diameter, the incident aperture is 20mm in diameter, and the specimen shape is approximately 50×50mm. Please feel free to contact us when you need our services. 【Applicable Standards】 ■Testing Standards - JISK7136:2000 Method for determining haze of transparent materials - JISK7361-1:1997 Test method for total light transmittance of transparent materials - JISK7105:1981 (discontinued) Test methods for optical properties of plastics *For more details, please refer to the related links or feel free to contact us.

  • Contract measurement

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